#include "adc.h"
#include "config.h"
#include <cstdio>

// TEST 调试宏定义
#if TEST_DEBUG
#define TEST_DEBUG_PRINT(fmt, ...) printf(fmt, ##__VA_ARGS__)
#else
#define TEST_DEBUG_PRINT(fmt, ...) ((void)0)
#endif

constexpr int status_print = 0;
extern sampler sampler;
void test_1111() {
	// 初始化 CAN 回环测试
	// can_loopback_init();
	// can_config();
	if (status_print) {
		/* value print */
		TEST_DEBUG_PRINT(" the temperature data is %2.2f degrees Celsius\r\n",
			   sampler.get_mcu_temp());
		TEST_DEBUG_PRINT(" the drv_temperature data is %2.2f degrees Celsius\r\n",
			   sampler.get_drv_temp());
		TEST_DEBUG_PRINT(" the U current data is %2.2f mA\r\n", sampler.get_current('U'));
		TEST_DEBUG_PRINT(" the V current data is %2.2f mA\r\n", sampler.get_current('V'));
		TEST_DEBUG_PRINT(" the W current data is %2.2f mA\r\n", sampler.get_current('W'));
		TEST_DEBUG_PRINT(" the VBUS is %2.2f V\r\n", sampler.get_vbus_voltage());
		// TEST_DEBUG_PRINT(" the angle is %2.2f\r\n", tle5012b_read());

		TEST_DEBUG_PRINT("\n----------------------------------------------------\n");
	}
	// can_loopback_test();
}